HOME > Publication > Papers

 
작성일 : 12-11-22 15:11
Sang-Ho Rha, Jisim Jung, Yoon soo Jung, Un Ki Kim, Yoon Jang Chung, Tae Joo Park, and Cheol Seong Hwang, “Performance variation according to device structure and the source/drain metal electrode of amorphous-indium- gallium–zinc oxide (a-IGZO) th…
 글쓴이 : 최고관리자
조회 : 1,178  
   http://doi.org/10.1109/TED.2012.2220367 [529]
Sang-Ho Rha, Jisim Jung, Yoon soo Jung, Un Ki Kim, Yoon Jang Chung, Tae Joo Park, and Cheol Seong Hwang,
 
“Performance variation according to device structure and the source/drain metal electrode of amorphous-indium-gallium–zinc oxide (a-IGZO) thin film transistors”,
 
IEEE Trans. Electron. Dev. 59(12), 3357-3363 (2012) - Nov.       (IF=2.620)