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작성일 : 12-05-15 20:11
Tae Joo Park, Prasanna Sivasubramani, Brian E. Coss, Bongki Lee, Robert M. Wallace, Jiyoung Kim, Mike Rousseau, Xinye Liu, Huazhi Li, Jean-Sebastien Lehn, Daewon Hong, and Deo Shenai “Reduction of residual carbon and nitrogen-related impurities by Al2O3
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   Reduction of Residual C and N-Related Impurities by Al2O3 Insertion in Atomic-Layer-Deposited La2O3 Thin Films.pdf (1.6M) [35] DATE : 2012-05-22 20:33:00
Tae Joo Park, Prasanna Sivasubramani, Brian E. Coss, Bongki Lee, Robert M. Wallace, Jiyoung Kim, Mike Rousseau, Xinye Liu, Huazhi Li, Jean-Sebastien Lehn, Daewon Hong, and Deo Shenai
 
“Reduction of residual carbon and nitrogen-related impurities by Al2O3 insertion into atomic-layer-deposited La2O3 thin films”
 
Electrochem. Solid Stat. Lett. 14(5), G23-G26 (2011) - Mar.       (IF=2.321)