Kuan Yew Cheong, Jeong Hyun Moon, Tae Joo Park, Jeong Hwan Kim, Cheol Seong Hwang, Hyeong Joon Kim, Wook Bahng and Nam-Kyun Kim
“Improved Electronic Performance of HfO2/SiO2 Stacking Gate Dielectric on 4H SiC”
IEEE Trans. Electron. Dev., 54 (12) 3409, (2007) - Dec. (IF=2.620)