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작성일 : 12-05-15 20:07
Deok-Yong Cho, S.-J. Oh, Tae Joo Park, and Cheol Seong Hwang, “Atomic rearrangements in HfO2/Si1-xGex interfaces”, Appl. Phys. Lett., 89, 132904 (2006)-Sep.
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Atomic rearrangements in HfO2Si1−xGex interfaces.pdf (332.4K)
[13]
DATE : 2012-05-22 20:59:13
Deok-Yong Cho, S.-J. Oh,
Tae Joo Park
, and Cheol Seong Hwang
“Atomic rearrangements in HfO2/Si1-xGex interfaces”
Appl. Phys. Lett., 89, 132904 (2006) - Sep.
(IF=3.495)
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