Sug Hun Hong, Jae Hyuck Jang, Tae Joo Park, Doo Seok Jeong, Miyoung Kim, and Cheol Seong Hwang
"Improvement of the current-voltage characteristics of a tunneling dielectric by adopting a Si3N4 /SiO2/Si3N4 multilayer for flash memory application"
Appl. Phys. Lett, 87, 152106 (2005) - Oct. (IF=3.495)