Tae Joo Park, Seong Keun Kim, Jeong Hwan Kim, Jaehoo Park, Moonju Cho, Suk Woo Lee, Sug Hun Hong, and Cheol Seong Hwang
"Electrical properties of high-k HfO2 films on Si1-xGex substrates"
Microelectron. Engineering, 80, 222-225 (2005) - Jun. (IF=2.020)