HOME > Publication > Papers

 
작성일 : 12-05-15 20:06
Jaehoo Park, Moonju Cho, Hong Bae Park, Tae Joo Park, Suk Woo Lee, Sug Hun Hong, Doo Seok Jeong, Chihoon Lee, Jihoon Choi and Cheol Seong Hwang, “Voltage induced degradation in self-aligned poly-Si gate n-type field effect transistors with HfO2 gate die
 글쓴이 : 최고관리자
조회 : 864  
   Voltage-induced degradation in self-aligned polycrystalline silicon gate.pdf (113.3K) [14] DATE : 2012-05-22 21:05:13
Jaehoo Park, Moonju Cho, Hong Bae Park, Tae Joo Park, Suk Woo Lee, Sug Hun Hong, Doo Seok Jeong, Chihoon Lee, Jihoon Choi and Cheol Seong Hwang
 
“Voltage induced degradation in self-aligned poly-Si gate n-type field effect transistors with HfO2 gate dielectrics”
 
Appl. Phys. Lett., 85 (24) 5965 (2004) - Dec.       (IF=3.495)