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작성일 : 17-04-29 17:07
Yoo Jin Jo, Jeong Hyun Moon, Ogyun Seok, Wook Bahng, Tae Joo Park*, and Min-Woo Ha* "Electrical Characteristics of SiO2/4H-SiC Metal-oxide-semiconductor Capacitors with Low-temperature Atomic Layer Deposited SiO2"
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   https://doi.org/10.5573/JSTS.2017.17.2.265 [299]
Yoo Jin Jo, Jeong Hyun Moon, Ogyun Seok, Wook Bahng, Tae Joo Park*, and Min-Woo Ha*

"Electrical Characteristics of SiO2/4H-SiC Metal-oxide-semiconductor Capacitors with Low-temperature Atomic Layer Deposited SiO2"

J. Semicond. Tech., 17(2), 265-270, (2017) - Apr   *Corresponding author       (IF=0.374)