Publication > papers > Min-Woo Ha, Kangmin Choi, Yoo Jin Jo, Hyun Soo Jin, and Tae Joo Park* "Contact Resistance and Leakage Current of GaN Devices with annealed Ti/Al/Mo/Au Ohmic contacts" J. Semicond. Tech. Sci., 16(2), 179-184, (2016)

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작성일 : 15-12-15 12:53

Min-Woo Ha, Kangmin Choi, Yoo Jin Jo, Hyun Soo Jin, and Tae Joo Park* "Contact Resistance and Leakage Current of GaN Devices with annealed Ti/Al/Mo/Au Ohmic contacts" J. Semicond. Tech. Sci., 16(2), 179-184, (2016) - April * Corresponding author

글쓴이 : 최고관리자

http://dx.doi.org/10.5573/JSTS.2016.16.2.179 [567]

Min-Woo Ha, Kangmin Choi, Yoo Jin Jo, Hyun Soo Jin, and Tae Joo Park*

"Contact Resistance and Leakage Current of GaN Devices with annealed Ti/Al/Mo/Au Ohmic contacts"

J. Semicond. Tech. Sci., 16(2), 179-184, (2016) - April * Corresponding author (IF=0.374)