Min-Woo Ha, Kangmin Choi, Yoo Jin Jo, Hyun Soo Jin, and Tae Joo Park*
"Contact Resistance and Leakage Current of GaN Devices with annealed Ti/Al/Mo/Au Ohmic contacts"
J. Semicond. Tech. Sci., 16(2), 179-184, (2016) - April * Corresponding author (IF=0.374)